Συντάχθηκε 17-01-2020 12:26
O Καθηγητής David Binkley, University of Tennessee, Knoxville, θα δώσει ομιλία:
Ώρα: 13-14 (άμεσα!!)
Ημέρα: (σήμερα) Παρασκευή, 17/1/2019
Αίθουσα Συνεδριάσεων, Σχολή ΗΜΜΥ, Πολυτεχνείο Κρήτης
Thermal noise, flicker noise, and local area mismatch analysis and optimization for a CMOS, folded cascode OTA -- The importance of MOS operation in both moderate and strong inversion.
David Binkley is a Principal Scientist at Siemens Molecular Imaging in Knoxville, TN engaged in the research and design of front-end analog and mixed-signal circuits for positron emission tomography (PET) medical imaging systems. Additionally, he is an Adjunct Professor in the Department of Electrical Engineering and Computer Science at the University of Tennessee where he teaches graduate classes in analog CMOS integrated circuit (chip) design. David was a Professor of Electrical and Computer Engineering at UNC Charlotte (2000 - 2012), cofounder and member of Concorde Microsystems (1998 - 2000, 1992 - 2004 part time), and Senior Scientist at CTI PET Systems, Inc. (1985 - 1998). David and colleagues have designed custom, mixed-signal CMOS integrated circuits for PET medical imaging systems manufactured by Siemens and battery operated, wireless and buried wire, pet containment systems manufactured by Pet Safe. David has published over 70 papers and the book, Tradeoffs and Optimization in Analog CMOS Design, John Wiley and Sons Ltd., June 2008, and holds nine U.S. patents. He has given tutorials and invited talks at numerous international conferences and universities, and was a visiting scientist at the Technical University of Munich. David received the B.S., M.S., and Ph.D. degrees in electrical engineering from the University of Tennessee, Knoxville.